Equiptment
Secondary Electron Detectors (SE)
- conventional Everhart-Thornley detector in the chamber
- In-lens detector, which utilizes secondary electrons, captured by the objective lens field
providing excellent surface detail
Backscattered Electron Detector (BSE)
- optimized for low voltage operation
Energy Dispersive Analysis System (EDS)
- Contains a state-of-the-art detector with a resolution of 129 eV at Manganese and a light
element detection limit of Boron
Electron Backscattered Kikuchi Pattern Detector
(EBKP)
- can collect patterns, analyze and store the data at the rate of one point every two seconds
- allowins an array of 27,000 points to be analyzed in a typical 15 hour period
Performance Specifications
Superb image resolution
- rated resolution is 1.2 nm at 20 kV
- 2.5 nm at 5 kV
- 40 nm at 1 kV
Designed to perform EDS analysis, BSE imaging and high
resolution SE imaging
- standard working distance of (8 mm)
- allows up to 45° of tilt
EDS system has a state-of-the-art detector
- resolution of 129 eV at Manganese
- a light element detection limit of Boron
Contact Person: Richard Noll, Manager of the SEM Facility.
- Phone:(608) 263-3667
- Email: noll@engr.wisc.edu
Charge structure: All Charges are per hour
Instrument Use
- $34 - Clients from the University of Wisconsin System.
- $44 – Clients from non-UW Universities.
- $119 – Clients from Industry.
Tech Support
- $35 - Clients from the University of Wisconsin System.
- $49 – Clients from non-UW Universities.
- $139 – Clients from Industry.
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