JEOL JSM-6100 Scanning Electron Microscope

Description: The JSM-6100 is a modern Scanning Electron Microscope (SEM) which uses a tungsten thermionic electron source. It is an excellent general purpose SEM. The SEM is equipped with an onboard image averaging and acquisition system that greatly improves operation under difficult imaging conditions. In addition, there is a PC based active image acquisition system that allows the capture, processing, and electronic storage of high-resolution images. Other accessories include a Backscattered Electron Detector (BSE), and a full-featured PC based Energy Dispersive Analysis System (EDS).

Key Performance Specifications: The instrument has excellent image resolution of 4.0 nm at 30 kV and 8 mm working distance. Captured image file resolution of digitally acquired images is as high as 4000 x 4000 pixels. Furthermore, a variety of image processing operations are available. In addition, the instrument is designed to perform EDS analysis, BSE imaging and high resolution SE imaging at one standard working distance (15 mm) while allowing up to 45° of tilt. The EDS system has a state-of-the-art detector with a resolution of 138 eV at Manganese and a light element detection limit of Boron.

Contact Person: Richard Noll, Manager of the SEM Facility. Phone: (608) 263-3667; Email: noll@engr.wisc.edu.

Charge structure: All Charges are per hour

Instrument Use

• $22 - Clients from the University of Wisconsin System.
• $44 – Clients from non-UW Universities.
• $75 – Clients from Industry.

Tech Support

• $35 - Clients from the University of Wisconsin System.
• $49 – Clients from non-UW Universities.
• $139 – Clients from Industry.