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Contact Us
Diana Rhoads
Materials Science Center
Room 264, Materials Science and Engineering Building
Madison, WI 53706
Phone: 608/263-1795
Fax: 608/262-8353
Email: rhoads@engr.wisc.edu
Web services: msc.engr.wisc.edu
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LEO912-OMEGA TEM
Features
- Tungsten or Lanthanum Hexaboride source
- Conventional TEM with a lattice resolution of 0.37 nm
- Microdiffraction over an extended camera length range.
- Convergent beam diffraction with continuously variable convergence
- Comprehensive ESI and EELS
- Digital imaging with high-resolution variable speed CCD camera
- Integrated image analysis
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TEM Imaging
- The operating voltage ranges from 60 kV to 120 kV. A full range of specimen stages is available, including, single tilt, cooling, and tilt-rotate. Magnification is selectable from 80x to 500kx.
- Both conventional and energy filtered images
- Mapping using EELS edges
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Analytical Microscopy
- Qualitative and quantitative electron energy loss spectroscopy (EELS)
- Qualitative electron spectroscopic imaging (ESI)
- Complete built in computer analysis of digital images and spectra
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Microdiffraction
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The technique of microdiffraction allows energy filtered diffraction patterns and EELS analysis to be done in very small regions, down to 1.6 nm diameter.
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Specifications
- Resolution: 0.37nm (point to point) 0.2 (line)
- Magnification: 80 - 500,000x
- Minimum beam diameter: 1.6 nm
- Specimen tilt: +/- 60 degrees
- Accelerating voltage change accuracy: 0.2 volts
- EELS resolution: 1.5 volts
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