Contact Us
Diana Rhoads
Materials Science Center
Room 264, Materials Science and Engineering Building
Madison, WI 53706
Phone: 608/263-1795
Fax: 608/262-8353
Email: rhoads@engr.wisc.edu
Web services: msc.engr.wisc.edu
Instruments
| Instrument | Description | Typical Applications | Location | Details | Manuals |
|---|---|---|---|---|---|
| TRANSMISSION ELECTRON MICROSCOPES (TEMs) | |||||
Philips CM200 UT [ Larger image. ] |
200 kV high-resolution Philips CM200 ULTRA TWIN TEM with 0.19 point resolution, Ge light element energy-dispersive x-ray spectroscopy (EDS), and full image processing and analysis capabilities | Application Data | 118 MS&E | Detailed Description | Alignment Manual |
LEO 912 [ Larger image. ] |
120 kV energy-filtered TEM (LEO EM 912) with integrated W filter that provides electron energy loss imaging, diffraction, and spectroscopy |
Application Data | 128 MS&E | Detailed Description | Manual |
| SCANNING ELECTRON MICROSCOPES (SEMs) | |||||
LEO 1530 FESEM
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A fully digital LEO GEMINI 1530 SEM with field emission electron gun, full orientation imaging based on backscattered electron Kikuchi patterns, and full EDS and control |
Application Data | 171 MS&E | Detailed Description | Operating Instructions (link to Georgia Tech) Full Manual (9.6-MB PDF) |
JEO JSM-6100
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JEOL 6100 SEM with an EDS x-ray analyzer and digital beam control |
173 MS&E | Detailed Description | ||
Zeiss 1500XB CrossBeam Workstation
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Ultra high-resolution imaging combined with a focussed ion beam and a gas injector system for materials deposition or enhanced etching. |
Application Data | 175 MS&E |
Detailed Description
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For biological and biomaterials SEM, see the Hitach S-570 and Hitachi S-900 SEMS in the Biological and Biomaterials Preparation, Imaging and Characterization Laboratory (BBPIC). |
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| X-RAY DIFFRACTION (XRD) | |||||
PANalytical X'Pert PRO
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PANalytical X-ray Diffractometer |
Application Data | 832 Engineering Research Building | Detailed Description | |
Siemens Stoe
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Stoe X-ray diffractometer |
Application Data | 1128 Engineering Research Building | Detailed Description | |
Rigaku Small-angle X-ray Scattering System
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Rigaku SAX |
832 Engineering Research Building | Detailed Description | ||
| SCANNING AUGER MICROSCOPE (SAM) | |||||
Perkin Elmer PHI Model 670
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Scanning Auger Microscope |
124 MS&E | Detailed Description | ||
| ELECRON SPECTROSCOPY FOR CHEMICAL ANALYSIS (ESCA) | |||||
Perkin Elmer 5400 ESCA
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Perkin Elmer 5400 ESCA Spectrometer: Phi Model 5400 combination angle-resolved small area ESCA/ISS system -- Because ISS is more sensitive to high-mass elements, the combination ESCA/ISS provides two complementary techniques for obtaining chemical surface composition in the high-mass range. The analysis area can be set at 0.2 mm, 0.6 mm, or 1 mm in diameter, or at 3 mm x 10 mm. |
Application Data | 124 MS&E | Detailed Description | |
| ATOMIC FORCE MICROSCOPY (AFM) | |||||
Digital Instruments AFM
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Digital Instruments AFM |
Application Data | 172 MS&E | Detailed Description | |
| ION BEAM LABORATORY | |||||
Rutherford Backscattering Spectrometry line
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Pelletron 1.7MV Tandem Accelerator and Beam Lines |
Detailed Description | |||
| RAMAN SPECTROSCOPY | |||||
Aramis Confocal Raman Microscope
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LabRAM Aramis Horiba Jobin Yvon Confocal Raman Microscope with 4 excitation sources and fast mapping mode |
Manufacturer's application notes | 177 MS&E | Detailed Description | |
| SAMPLE PREPARATION FACILITIES | |||||
| For ultramicrotomy, free-drying, and other biological or biomaterials preparation, see the Biological and Biomaterials Preparation, Imaging and Characterization Laboratory (BBPIC) preparation facility. | |||||
